Biography
Dr. Indrajith Rajapaksa is a Senior Software Engineer in Defect metrology analytics software development at Intel Corp. Previously, he worked as a postdoctoral researcher at Oak Ridge National Laboratory, developing software and tools to explore higher-order harmonics in band excitation scanning probe microscopy for Ferroelectric materials. He holds a PhD in Electrical Engineering and Computer Science from the University of California, Irvine, and has numerous publications in defect metrology and material analysis. Dr. Rajapaksa has multiple patents and publications in metrology imaging, IoT, and data transfer
Courses
- Cloud Application Development